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Plano, TX 75024-6608
Biography
Dr. Alassaad has experience in the areas of optical metrology for nanolithography, nanoscale LEDs for biosensing, scatterometry instrumentation, diffractive optics design, and computer modeling.
Dr. Alassaad worked as a Research Associate in the Nanoscale Integration Lab at the University of Texas at Dallas, as well as in the Optical Instrumentation Lab. Dr. Alassaad’s research work includes statistical data analysis, electromagnetic modeling (RCWA and FDTD), critical dimension optical metrology in semiconductor processing, inverse linear problem optimization techniques, and statistical error analysis.
Prior to Dr. Alassaad’s work at the University of Dallas, he was a teaching assistant for undergraduate electrical engineering courses at the University, including the Electronic Circuits Lab and Electronics Devices and Advanced Engineering Math. Dr. Alassaad was also a computer programmer at BAB International for several years.
Dr. Alassaad is fluent in French as well as English.
Education
Ph.D., Electrical Engineering, 2005
University of Texas at Dallas
M.S., Electrical Engineering, 2003
University of Texas at Dallas
B.S., Computer Science, 1998
Lebanese American University
Publications/Presentations
R.M. Al-Assaad, E.M. Drege, D. M. Byrne, Proc. SPIE 4692, pp. 17-28, 2002.
E.M. Drege, J.M. Al-Assaad, D. M. Byrne, Proc. SPIE 4689, pp. 151-162, 2002.
R. Al-Assaad and D. Byrne, Op. Soc. Am. A 24, pp. 326-338, 2007.
R. M. Al-Assaad, L. Tao and W. Hu, Proc. SPIE 6517-6521, accepted for publication April 2007.
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