Education
Ph.D., Analytical Chemistry, 1991
University of Texas - Austin
M.S., Analytical Chemistry, 1990
University of Texas - Austin
B.S., Chemistry, 1987 (cum laude)
University of Texas at Dallas
Publications
"Specialty Gas Analysis: A Practical Guidebook", John Wiley & Sons - Publisher
"Handbook of Semiconductor Chemicals", John Wiley & Sons – Publisher
"Mass discrimination in laser desorption/Fourier transforms ion cyclotron resonance mass spectrometry cation-attachment spectra of polymers;",Jeremiah D. Hogan, David A. Laude Jr.; Anal. Chem., 1992, 64 (7), pp 763–769.
"Precursor ions for gas-phase cation-attachment reactions in laser desorption/Fourier transform ion cyclotron resonance mass spectrometry;",Hogan, Jeremiah D.; Laude, David A., Jr.; Anal. Chem., 63 (19), 1991.
"Probe-mounted fiber optic assemblies for laser desorption/ionization Fourier transforms mass spectrometry",Jeremiah D. Hogan, Steven C. Beu, David A. Laude Jr., Vahid Majidi; Anal. Chem., 1991, 63 (14), pp 1452–1457.
"Suspended trapping procedure for alleviation of space charge effects in gas chromatography/Fourier-transform mass spectrometry",Jeremiah D. Hogan, David A. Laude Jr.; Anal. Chem., 1990, 62 (5), pp 530–535
"Laser desorption/ionization Fourier transform mass spectrometry and fast-atom bombardment spectra of nonvolatile polymer additives",Jeremiah D. Hogan, L. Johlman, Charles L. Wilkins, Tracy L. Donovan, David A. Laude Jr., M. Joseph Youssefi; Anal. Chem., 1990, 62 (11), pp 1167–1172
Dr. Hogan formerly served as the Director of Analytical Laboratories for Texas Instrument, Inc. for 18 years. He has worked in the areas of liquid, solid, and gas phase analysis of semiconductor-related materials, as well as surface analysis and cross-section analysis and imaging of semiconductor materials and devices. He has experience with broad range of analytical equipment and techniques including ICP/MS, ICP/AES, ICP/OES, FT-ICR/MS, IC, HPLC, GC, GC/MS, GC/AED, GC/FT-ICR/MS, AA, GFAA, FAB-MS, IT-MS, sector, ion trap, and quadrupole MS, SIMS, ToF-SIMS, AES, XPS, XRD, FTIR, UV-VIS, NMR, CZE, CZE-FT-ICR/MS, fluorescence spectroscopy, and imaging techniques including SEM, FIB, TEM, and LEAP atom probe.
In addition, Dr. Hogan served as Director of Electronic Chemicals R&D for American Air Liquide, Inc., and has taught instrumental analysis at the University of Texas at Dallas.
Prior to the above, Dr. Hogan worked as a corrosion chemist for Sun Oil Company (Sunoco), characterizing treatment chemicals for oilfield equipment and downhole applications, as well as recommending treatment regimens for specific applications. He also worked with the failure analysis and material science groups.
Dr. Hogan was also a machinist in the U.S. Navy Submarine Service, serving aboard ballistic missile nuclear submarines, as well as the ultra-deep diving bathyscaph Trieste II (DSV-1).
